레포트 (3)
[화학공학]ArO2 분압비에 의존하는 ZnO 박막의 물리적 특성
Morphological, Structural and Electrical properties of deposited films were investigated in comparison with pure ZnO Thin film by scanning electronic microscopy (SEM), Atomic force microscopy (AFM), X-ray diffraction (XRD), PL spectra and other electrical analytic method. SEM images showed all films have similar growth vertical orientations. AFM images showed the grain scale and roughness of thin
16페이지 | 1,600원 | 2010.09.08
[반도체공정]주사전자현미경(Scanning Electron Microscopy)
Ray 등투과상, 반사상Contrast기하학적 성질, 물리학적 성질광의 흡수 및 반사 (색, 명암)주 용도Sub-micron inspectionMicro scale inspectionSEM의 특징 -2현미경의 내부는 진공상태 - 전자는 공기와 충돌하면 에너지가 소실되거나 굴절되는 등 원하는 대로 제어하기 어렵기 때문배율 - 표본과 대물렌즈와 렌즈
17페이지 | 1,700원 | 2010.09.08
[화학공학]Study of structural and optical properties of Ge and Sn doped ZnO films(영문)
morphology of the products were investigated by X-ray diffraction (XRD, Siemens D5000). The elemental contents of the products were investigated using energy dispersive X-ray (EDX, Quanta 200F). Room temperature photoluminescence (PL, Jobin Yvon Horiba HR 800 UV) spectroscopy was employed to study the optical properties of the ZnO films using a He–Cd laser with a wavelength of 325 nm as the exc
6페이지 | 1,100원 | 2010.08.20