[신소재공학] XRD 원리(영문)
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추천 연관자료
- 목차
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1. Experiment Purpose
2. Theory
2.1. Principle of XRD
3. Experiment Method
3.1. Making a Sample Powder
3.2. Filling up Powder at Sample Holder
4. Analysis Method
4.1. Basic Principles
4.2. Powder Diffraction File
4.2.1. Hanawalt Method
4.2.2. Fink Method
5. Experiment Result
6. Investigation sample
6.1. Aluminium Nitride(AlN)
6.1.1. Properties
6.1.2. Applications
6.2. Titanium Dioxide(TiO₂)
6.2.1. Properties
6.2.2. Applications
7. Error Analysis
7.1. Line Superposition
7.2. Preferred Orientation
7.3. PDF Itself
7.4. XRD Equipment
7.5. Sample
8. Role of Team Members
9. Experiment Schedule
10. Reference
- 본문내용
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3. Experiment Method
A measurement method of sample of powder form is an x-ray diffractometor(Fig. 9).
Fig. 9. An x-ray diffractometer.
3.1. Making of Sample Powder
A Sample is made a powder form. A diameter of powder has good reproducibility as smaller. But generally 10~35μm is a suitable size of sample. We must caution a deterioration by air, gas, humidity and pouring of impurities in procedure of sample grinding.
3.2. Filling up Powder at Sample Holder
X-ray diffractometer need to a flat sample plane of 1cm×2cm. We fill up powder at holder to obtain a flat sample plane. A procedure is below(Fig. 10) when we fill up at a general metal holder.
Fig. 10. Filling up at a general metal holder.
1) Put a sample over thick glass plate(A direction of sample holder surface is below).
2) Fill up a powder uniformly at a hole of a sample holder.
3) Cover it with a paper and press down with edge of a finger.
4) A plane which is a contact a glass plate is a plane using a measurement.
When a powder is a small quantity, we use a glass sample holder. A procedure is below(Fig. 11).
Fig. 11. Filling up at a general glass holder.
1) A hole is already dig at glass holder. A depth of hole is 0.1~0.3mm.
2) Put a powder of a small quantity in a hole.
3) Press down with a glass plate.
4) Repeat 2)~3)procedure for identical plane of sample and glass plate.
When we fill up a sample at a holder, if a surface of sample is identical with a surface of holder, A rotation-axis of goniometer is identical with a surface of sample(Fig. 12(a)). If a surface of sample is higher or lower than a surface of holder, a diffraction line is shift to one side(Fig. 12(b)), thus we undergo a difficult analysis.
- 참고문헌
-
[1] B.D.Cullity, 「Elements of X-ray diffraction」Second edition, Addison wesley
[2] B.D.Cullity, 고태경 역, 「X선 회절」 Third edition, Pearson Prentice Hall
[3] 한봉회, 「X線 回折의 基礎」, 동명사
[4] James F.Shackelford, 「Introduction materials science for engineers」 Fifth edition,
Pearson Prentice Hall
[5] James F.Shackelford, 변재동, 박영구, 유상임, 장현구 공역, 「재료과학」 Fifth edition,
Pearson Prentice Hall
[6] Charles Kittle, 우종천, 신성철, 유건호, 이성익, 이재일, 홍승훈 공역, 「고체물리학」,
범한서적주식회사
[7] M.Ali Omar, 「Elementary solid state physics」
[8] www.wikipedia.org
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